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Design of a Universal Test Platform for Radiation Testing of Digital Components

Design of a Universal Test Platform for Radiation Testing of Digital Components

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Publisher: Storming Media

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Condition: Please note that this is a report or document and is not a book, per se. It is 195 pages long and is Velobound in a soft linen cover. This technical report was sponsored by the Pentagon and is provided in the best form available to the government. Sometimes our report quality is picture perfect and in color; other times, particularly for older reports, extensive black-and-white photocopying has degraded the quality. If you have any questions about quality of a particular report, please ask and we would be happy to describe it in more detail.

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Product Description
This is a NAVAL POSTGRADUATE SCHOOL MONTEREY CA report procured by the Pentagon and made available for public release. It has been reproduced in the best form available to the Pentagon. It is not spiral-bound, but rather assembled with Velobinding in a soft, white linen cover. The Storming Media report number is A365223. The abstract provided by the Pentagon follows: In this research, programmable, microcontroller-based test hardware was designed, constructed, debugged, and programmed. The wire-wrapped board will be used to test two custom static random access memory (SRAM) chips, as well as other custom chips designed at the Naval Postgraduate School. Components for the test hardware were selected to allow prototyping with standard parts that can later be replaced with radiation hardened parts as budgets permit. Control of the test hardware is via a RS-232 serial interface, which allows remote control programming and monitoring of the test hardware and device being tested.

Product Specifications


Media: Spiral-bound
Pages: 195
ISBN: 1423574729
EAN: 9781423574729
Publication Date: 1996



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